A mobile communication system has a plurality of mobile stations and a base station which includes a plurality of antennas, a frequency shift portion, a combining portion, a receiving portion and a signal processing portion. The antenna receives radio waves transmitted by the mobile stations. The frequency shift portion shifts the received signal with a frequency corresponding to each of the antennas. The combining portion determines the shifted signal as a combining signal. The receiving portio…

A sensor enables simultaneous or sequential eddy current and optical reflectance measurements of conducting film by providing an eddy current inspection coil and a first and a second optical fiber extending axially through the coil. The eddy current inspection coil is excited by a radio frequency generator and induces eddy currents in the conducting film which are sensed using a detector. The conducting film is illuminated by a first optical fiber, and light which is reflected from the conductin…

Method and apparatus for optical inspection of an article are presented. The apparatus comprises an illumination unit and at least one detection unit. The illumination unit generates an incident beam and directs it onto a predetermined region of the article. The detection unit includes a light collection system and a detector. The light collection system collects light scattered from the illuminated region with a predetermined constant maximum collection angle, and utilizes a variable angle desi…

The image display device includes a liquid crystal display device having a liquid crystal panel and a backlight and a backlight controller for allowing the backlight of the liquid crystal display device to be bright when environment light is bright and allowing the backlight to be dark when the environment light is dark such that light leak (minimum luminance) which is defined by an extinction ratio of liquid crystal will not grow more than a specified degree. The image display device enables di…

A method and system for automatic EDX analysis of defects quantitatively take into consideration x-ray signals attributable to the background. The method and system are capable of automatically identifying suitable locations for background and defect x-ray sampling. The method and system are also capable of effectively and quantitatively, rather than qualitatively, removing signals attributable to the background and not the defect. One advantageous feature that enables the method and system to h…

A photolithographic track system for semiconductor wafer manufacture, that includes an Atomic Force Microscope (AFM), having a scanning stylus probe measurement device coupled to the AFM head, for measuring overlay between masks and layers in an inspected wafer, so as to generate overlay data. The AFM is situated in-track.

A method and apparatus for use in conjunction with a plasma reaction chamber provide both throttling functionality and independent vacuum isolation for a turbomolecular pump. A throttle valve provides for precise reaction chamber pressure regulation, and a gate valve prevents extended exposure of the turbomolecular pump to atmospheric conditions during cleaning or other maintenance operations. The throttle valve and the gate valve may be actuated independently.

A rubber-steel cord composite comprising a steel cord having, in a planar image of the steel cord formed by X-rays passing through the steel cord, a fraction R of the total area occupied by filaments of from 0.45 or more to 0.95 or less in an arbitrarily selected portion of the steel cord having a length of 15 mm in an axial direction of the cord, is provided. The length of 15 mm in an axial direction of the cord means a length of 15 mm in an axial direction of an actual cord and the fraction R …

A drop-on-demand ink-jet printing head provided with an array of a plurality of piezoelectric elements arranged at regular intervals and fixed at their one ends to a base, the other ends of the respective piezoelectric elements being free ends which are disposed in opposition to nozzle respective apertures, the piezoelectric elements being formed by cutting, at predetermined width, a piezoelectric plate obtained by firing a lamination of paste-like piezoelectric material conductive material stac…

A cooling system and a semiconductor apparatus, in which the cooling system may supply a reaction chamber with a coolant (such as helium or a mixture containing helium) during a semiconductor wafer fabrication process. The cooling system may generally include a printed circuit board, a coolant flow controller having a setpoint control to set a flow of coolant by transmitting a voltage signal to the printed circuit board, and a filter for removing undesired noise from the voltage signal to stabil…